@InProceedings{Jeon_2023_CVPR,
    author    = {Jeon, Daniel S. and Meuleman, Andr\'eas and Baek, Seung-Hwan and Kim, Min H.},
    title     = {Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media},
    booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)},
    month     = {June},
    year      = {2023},
    pages     = {12353-12362}
}
Daniel S. Jeon Andréas Meuleman Seung-Hwan Baek Min H. Kim
Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media