 The profile widths of the silver behenate peaks were found to be consistently larger than those of the silicon peaks, indicating significant line broadening for silver behenate.The average crystallite size along the long-spacing direction of silver behenate was estimated using the Scherrer equation, giving "D"(avg) = 900 (50) Å (85–95 nm).Because silver behenate has a large number of well defined diffraction peaks in the 1.5-20.0° 2-theta range, it is suitable for use as an angle-calibration standard for low-angle diffraction.