 The figure displays an optical micrograph of a cleavage plane of a separated chip of 150 µm thickness that was subjected to four laser scans, compare.The topmost defects are the best resolved and it is realized that a single laser pulse causes a defected crystal region that resembles the shape of candle flame.This shape is caused by the rapid melting and solidification of the irradiated region in the laser beam focus, where the temperature of only some µm3 small volumes suddenly rises to some 1000 K within nanoseconds and falls to ambient temperature again.