 These peaks correspond to the electron configuration of the electrons within the atoms, e.g., 1"s", 2"s", 2"p", 3"s", etc.The number of detected electrons in each peak is directly related to the amount of element within the XPS sampling volume.To generate atomic percentage values, each raw XPS signal is corrected by dividing the intensity by a "relative sensitivity factor" (RSF), and normalized over all of the elements detected.