 It was based on gate-all-around (GAA) FinFET technology.The scanning tunneling microscope, an instrument for imaging surfaces at the atomic level, was developed in 1981 by Gerd Binnig and Heinrich Rohrer at IBM Zurich Research Laboratory, for which they were awarded the Nobel Prize in Physics in 1986.Binnig, Calvin Quate and Christoph Gerber invented the first atomic force microscope in 1986.