 For quantitative analysis, the normalized fluorescence or photoelectron yield formula_1 is described by 
formula_2,
where formula_3 is the reflectivity and formula_4 is the relative phase of the interfering beams.The characteristic shape of formula_1 can be used to derive precise structural information about the surface atoms because the two parameters formula_6 (coherent fraction) and formula_7 (coherent position) are directly related to the Fourier representation of the atomic distribution function.Therefore, with a sufficiently large number of Fourier components being measured, XSW data can be used to establish the distribution of the different atoms in the unit cell (XSW imaging).