63fb46d6_bster_US___Patent_applications__Description
[Patent application number] 20120020570 [Published] 01-26-2012 [Description] 
THIN LINE DETECTION AND ENHANCEMENT FOR ELECTRONIC IMAGES HAVING DIFFERENT RESOLUTIONS - A methodology for thin line detection and enhancement in electronic images is disclosed. The methodology includes associating an electronic image with at least one basic context window that is less than the size of the electronic image based on the input image resolution of the electronic image; detecting one or more predefined patterns which correspond to thin lines in the electronic image using the at least one basic context window; excluding patterns for the one or more detected patterns which are halftone patterns; and adding at least one pixel to the electronic image based on at least one of the remaining patterns so as to enhance thin line features in the electronic image. In some implementation, the methodology may be configured to handle electronic images having different resolutions. A system for thin line detection and enhancement in electronic images having different resolutions is also disclosed.
Xing Li, Webster US - Patent applications