6e774409_ISABILITY_CLAIMS___Patents_com__Description
[Patent #] 2011/0172982 [Description] 
SITE BASED QUANTIFICATION OF SUBSTRATE TOPOGRAPHY AND ITS RELATION TO LITHOGRAPHY DEFOCUS AND OVERLAY A method and system for modeling and analyzing wafer nanotopography data utilizes a nonlinear contact finite element model. Inputs to the model include...
Applications filed at Jul 14 2011 | COMPUTER SYSTEM FOR APPLYING PROACTIVE REFERRAL MODEL TO LONG TERM DISABILITY CLAIMS | Patents.com