Scanning tunnelling microscopy (STM) and transmission electron
microscopy (TEM) are two well-known atomic imaging techniques.
The combination of these two microscopies, deriving from the
concepts of nano-eye in STM and nano-finger in TEM, provides in
situ observation and measurement to accompany the growth and
manipulation of nanostructures. For example, the above HRTEM
picture (left), in comparison with the simulated scheme (right),
depicts how the group uses the STM@TEM functionality to tailor
an ultrasharp CNT apex to approach the dimensions of a single-
walled CNT.  A key advantage of the team's set-up is that the
entire experiment can be operated in a UHV chamber (<
3 x 10–10 mbar), which reduces the exposure of the manipulated
nanostructures to contaminants. In addition, the synchronous
control can eliminate unexpected damage that can occur during
sample transfer.  In their recent paper, the researchers
describe in detail how to fabricate CNT probes using the UHV
technique and highlight the advantages of