Resources Contact Us Home Semiconductor memory device having
test pattern generating circuit  Image Number 2 for United
States Patent #4821238.  A semiconductor memory device comprises
an internal circuit including a memory circuit; a test pattern
generating circuit; an element for receiving external signals
supplied from the outside; and an input switching circuit
connected between the test pattern generating circuit and the
receiving element, for switching the input supplied to the
internal circuit between output signals generating from the test
pattern generating circuit and the external signals, the output
signals generated from the test pattern generated circuit being
input to the internal circuit through the input switching
circuit in a test mode, the external signals being input to the
internal circuit through the input switching circuit in a usual
mode; the test pattern generating circuit, the input switching
circuit, and the internal circuit being provided on the same
chip.    Recently Added Patents