With high-energy (e.g., 200 keV, 32 fJ) electrons in a transmission electron microscope, the energy dependence of higher-order Laue zone (HOLZ) lines in convergent beam electron diffraction (CBED) patterns allows one, in effect, to directly image cross-sections of a crystal's three-dimensional dispersion surface. This dynamical effect has found application in the precise measurement of lattice parameters, beam energy, and more recently for the electronics industry: lattice strain.