If the sample is tilted relative to the electron beam, different sets of crystallographic planes contribute to the pattern yielding different types of diffraction patterns, approximately different projections of the reciprocal lattice, see Figure 11. This can be used to determine the crystal orientation, which in turn can be used to set the orientation needed for a particular experiment. Furthermore, a series of diffraction patterns varying in tilt can be acquired and processed using a diffraction tomography approach. There are ways to combine this with direct methods algorithms using electrons and other methods such as charge flipping, or automated diffraction tomography to solve crystal structures.