Precession electron diffraction (PED), invented by Roger Vincent and Paul Midgley in 1994, is a method to collect electron diffraction patterns in a transmission electron microscope (TEM). The technique involves rotating (precessing) a tilted incident electron beam around the central axis of the microscope, compensating for the tilt after the sample so a spot diffraction pattern is formed, similar to a SAED pattern. However, a PED pattern is an integration over a collection of diffraction conditions, see Figure 19. This integration produces a quasi-kinematical diffraction pattern that is more suitable as input into direct methods algorithms using electrons to determine the crystal structure of the sample. Because it avoids many dynamical effects it can also be used to better identify crystallographic phases.