Cosmic rays have sufficient energy to alter the states of circuit components in electronic integrated circuits, causing transient errors to occur (such as corrupted data in electronic memory devices or incorrect performance of CPUs) often referred to as " soft errors ". This has been a problem in electronics at extremely high-altitude, such as in satellites, but with transistors becoming smaller and smaller, this is becoming an increasing concern in ground-level electronics as well. Studies by IBM in the 1990s suggest that computers typically experience about one cosmic-ray-induced error per 256 megabytes of RAM per month. To alleviate this problem, the Intel Corporation has proposed a cosmic ray detector that could be integrated into future high-density microprocessors, allowing the processor to repeat the last command following a cosmic-ray event. ECC memory is used to protect data against data corruption caused by cosmic rays.