Photo-reflectance is a particularly convenient type of modulation spectroscopy, as it may be performed at room temperature and only requires the sample have a reflecting surface. It is an established tool for non-contact determination of material and electronic properties of semiconductor films. In photo-reflectance, a pump laser beam is used to modulate the free charge density in a semiconductor sample (via photo-injection), thereby modulating one or more physical quantities (e.g. the internal electric field). The measured signal ΔR is the change in amplitude of the reflected probe light as the intensity modulated pump radiation interacts with the sample. The normalized signal is ΔR/R, i.e. the pump-induced change in reflectance (AC) divided by the baseline reflectance (DC). The conventional photo-reflectance apparatus uses a spectroscopic source for the probe beam, such that the signal may be recorded as a function of the probe light's wavelength. Generally, the signal may be written: