The quality of an SKP measurement is affected by a number of factors. This includes the diameter of the SKP probe, the probe to sample distance, and the material of the SKP probe. The probe diameter is important in the SKP measurement because it affects the overall resolution of the measurement, with smaller probes leading to improved resolution. On the other hand, reducing the size of the probe causes an increase in fringing effects which reduces the sensitivity of the measurement by increasing the measurement of stray capacitances. The material used in the construction of the SKP probe is important to the quality of the SKP measurement. This occurs for a number of reasons. Different materials have different work function values which will affect the contact potential measured. Different materials have different sensitivity to humidity changes. The material can also affect the resulting lateral resolution of the SKP measurement. In commercial probes tungsten is used, though probes of platinum, copper, gold, and NiCr has been used. The probe to sample distance affects the final SKP measurement, with smaller probe to sample distances improving the lateral resolution and the signal-to-noise ratio of the measurement. Furthermore, reducing the SKP probe to sample distance increases the intensity of the measurement, where the intensity of the measurement is proportional to 1/d, where d is the probe to sample distance. The effects of changing probe to sample distance on the measurement can be counteracted by using SKP in constant distance mode.