In TEM, the electron beam passes through a thin film of the material as illustrated in Figure 10. Before and after the sample the beam is manipulated by the electron optics including magnetic lenses, deflectors and apertures ; these act on the electrons similar to how glass lenses focus and control light. Optical elements above the sample are used to control the incident beam which can range from a wide and parallel beam to one which is a converging cone and can be smaller than an atom, 0.1 nm. As it interacts with the sample, part of the beam is diffracted and part is transmitted without changing its direction. This occurs simultaneously as electrons are everywhere until they are detected (wavefunction collapse) according to the Copenhagen interpretation.