Below the sample, the beam is controlled by another set of magnetic lneses and apertures. Each set of initially parallel rays (a plane wave) is focused by the first lens (objective) to a point in the back focal plane of this lens, forming a spot on a detector ; a map of these directions, often an array of spots, is the diffraction pattern. Alternatively the lenses can form a magnified image of the sample. Herein the focus is on collecting a diffraction pattern; for other information see the pages on TEM and scanning transmission electron microscopy.