It is common to combine it with other methods, for instance images using selected diffraction beams, high-resolution images showing the atomic structure, chemical analysis through energy-dispersive x-ray spectroscopy, investigations of electronic structure and bonding through electron energy loss spectroscopy, and studies of the electrostatic potential through electron holography ; this list is not exhaustive. Compared to x-ray crystallography, TEM analysis is significantly more localized and can be used to obtain information from tens of thousands of atoms to just a few or even single atoms.