Such an analysis was performed by Di Ventra and Pershin with regard to the genuine current-controlled memristor. As the proposed dynamic state equation provides no physical mechanism enabling such a memristor to cope with inevitable thermal fluctuations, a current-controlled memristor would erratically change its state in course of time just under the influence of current noise. Di Ventra and Pershin thus concluded that memristors whose resistance (memory) states depend solely on the current or voltage history would be unable to protect their memory states against unavoidable Johnson–Nyquist noise and permanently suffer from information loss, a so-called "stochastic catastrophe". A current-controlled memristor can thus not exist as a solid-state device in physical reality.