A CBED pattern consists of disks arranged similar to the spots in SAED. Intensity within the disks represents dynamical diffraction effects and symmetries of the sample structure, see Figure 7 and 18. Even though the zone axis and lattice parameter analysis based on disk positions does not significantly differ from SAED, the analysis of disks content is more complex and simulations based on dynamical diffraction theory is often required. As illustrated in Figure 18, the details within the disk change with sample thickness, as does the inelastic background. With appropriate analysis CBED patterns can be used for indexation of the crystal point group, space group identification, measurement of lattice parameters, thickness or strain.