The basis of SSNTDs is that charged particles damage the detector within nanometers along the track in such a way that the track can be etched many times faster than the undamaged material. Etching, typically for several hours, enlarges the damage to conical pits of micrometer dimensions, that can be observed with a microscope. For a given type of particle, the length of the track gives the energy of the particle. The charge can be determined from the etch rate of the track compared to that of the bulk. If the particles enter the surface at normal incidence, the pits are circular; otherwise the ellipticity and orientation of the elliptical pit mouth indicate the direction of incidence.