X- ray diffraction patterns of plastic crystals are characterized by strong diffuse intensity in addition to the sharp Bragg peaks. In a powder pattern this intensity appears to resemble an amorphous background as one would expect for a liquid, but for a single crystal the diffuse contribution reveals itself to be highly structured. The Bragg peaks can be used to determine an average structure but due to the large amount of disorder this is not very insightful. It is the structure of the diffuse scattering that reflects the details of the constrained disorder in the system. Recent advances in two-dimensional detection at synchrotron beam lines facilitate the study of such patterns.