Unlike crystalline materials which exhibit strong Bragg diffraction, the diffraction patterns of amorphous materials are characterized by broad and diffuse peaks. As a result, detailed analysis and complementary techniques are required to extract real space structural information from the diffraction patterns of amorphous materials. It is useful to obtain diffraction data from both X-ray and neutron sources as they have different scattering properties and provide complementary data. Pair distribution function analysis can be performed on diffraction data to determine the probability of finding a pair of atoms separated by a certain distance. Another type of analysis that is done with diffraction data of amorphous materials is radial distribution function analysis, which measures the number of atoms found at varying radial distances away from an arbitrary reference atom. From these techniques, the local order of an amorphous material can be elucidated.