A photoionization microscope employs photoionization, along with quantum properties and principles, to measure atomic properties. The principle is to study the spatial distribution of electrons ejected from an atom in a situation in which the De Broglie wavelength becomes large enough to be observed on a macroscopic scale. An atom in an electric field is ionized by a focused laser. The electron is drawn toward a position-sensitive detector, and the current is measured as a function of position. The application of an electric field during photoionization allows confining the electron flux along one dimension.