That experimentally measured yield strength is significantly lower than the expected theoretical value can be explained by the presence of dislocations and defects in the materials. Indeed, whiskers with perfect single crystal structure and defect-free surfaces have been shown to demonstrate yield stress approaching the theoretical value. For example, nanowhiskers of copper were shown to undergo brittle fracture at 1 GPa, a value much higher than the strength of bulk copper and approaching the theoretical value.