The occurrence of amorphous phases turned out to be a phenomenon of particular interest for the studying of thin-film growth. The growth of polycrystalline films is often used and preceded by an initial amorphous layer, the thickness of which may amount to only a few nm. The most investigated example is represented by the unoriented molecules of thin polycrystalline silicon films. Wedge-shaped polycrystals were identified by transmission electron microscopy to grow out of the amorphous phase only after the latter has exceeded a certain thickness, the precise value of which depends on deposition temperature, background pressure, and various other process parameters. The phenomenon has been interpreted in the framework of Ostwald's rule of stages that predicts the formation of phases to proceed with increasing condensation time towards increasing stability.