In convergent beam electron diffraction (CBED), the incident electrons are normally focused in a converging cone-shaped beam with a crossover located at the sample, e.g. Figure 17, although other methods exist. Unlike the parallel beam, the convergent beam is able to carry information from the sample volume, not just a two-dimensional projection available in SAED. With convergent beam there is also no need for the selected area aperture, as it is inherently site-selective since the beam crossover is positioned at the object plane where the sample is located.