The most popular class of sensors for this technique were developed by Wolter, Bayer, and Greschner at IBM and are made from silicon pointing in the [001] [zero-zero-one] direction.
The most popular class of sensors for this technique were developed by Wolter, Bayer, and Greschner at IBM and are made from silicon pointing in the [001] [zero-zero-one] direction. Oscillating at sufficiently large amplitudes can overcome the "jump-to-contact" instability caused by attractive forces in this technique. This technique improves on its predecessor by not requiring a conductive sample or vacuum conditions. Frequency modulation is used to interpret results from this technique by relating the change in the sensor's (*) eigenfrequency to the change in its effective spring constant. The surface profile is commonly measured by the beam-bounce method, in which a deflection of the probe shifts the position of a laser beam reflecting off the probe. For 10 points, name this form of scanning probe microscopy in which a surface is imaged by monitoring the deflection of a cantilever.
The most popular class of sensors for this technique were developed by Wolter, Bayer, and Greschner at IBM and are made from silicon pointing in the [001] [zero-zero-one] direction.
atomic force microscopy [or AFM, or scanning force microscopy, or SFM, prompt on scanning probe microscopy before mention]