A vector named for this process is written as 4 pi sin theta over wavelength.
The Mott-Bethe formula converts a quantity that characterizes this process between two different forms. For larger q, this process' likelihood is proportional to q-4 while at smaller q it is roughly exponential; those two cases are Porod's law and Guinier's approximation respectively. This process is analyzed in a method for determining nanoscale structures called SAXS. The effect of an atom on this process is considered by (*) the form factor, multiples of which are considered to determine a structure factor. The Debye-Waller factor describes how thermal motion of atoms lowers the intensity of this process. A vector named for this process is written as 4 pi sin theta over wavelength. Diffraction limits the possible patterns caused by this process. Many structure analysis techniques consist of firing X-rays or neutrons at a target and observing the results of this process. For 10 points, X-rays can experience the elastic form of what process where a particle's trajectory changes after encountering another particle.
The Mott-Bethe formula converts a quantity that characterizes this process between two different forms.
elastic scattering [accept X-ray scattering or neutron scattering; prompt on diffraction]