Frequency modulation is used to interpret results from this technique by relating the change in the sensor's (*) eigenfrequency to the change in its effective spring constant.
The most popular class of sensors for this technique were developed by Wolter, Bayer, and Greschner at IBM and are made from silicon pointing in the [001] [zero-zero-one] direction. Oscillating at sufficiently large amplitudes can overcome the "jump-to-contact" instability caused by attractive forces in this technique. This technique improves on its predecessor by not requiring a conductive sample or vacuum conditions. Frequency modulation is used to interpret results from this technique by relating the change in the sensor's (*) eigenfrequency to the change in its effective spring constant. The surface profile is commonly measured by the beam-bounce method, in which a deflection of the probe shifts the position of a laser beam reflecting off the probe. For 10 points, name this form of scanning probe microscopy in which a surface is imaged by monitoring the deflection of a cantilever.
The most popular class of sensors for this technique were developed by Wolter, Bayer, and Greschner at IBM and are made from silicon pointing in the [001] [zero-zero-one] direction.
atomic force microscopy [or AFM, or scanning force microscopy, or SFM, prompt on scanning probe microscopy before mention]