Enhancing Reliability of Neural Networks at the Edge: Inverted
  Normalization with Stochastic Affine Transformations
Soyed Tuhin Ahmed Kamal Danouchi Guillaume Prenat Lorena Anghel Mehdi B. Tahoori
Bayesian Neural Networks (BayNNs) naturally provide uncertainty in their
predictions, making them a suitable choice in safety-critical applications.
Additionally, their realization using memristor-based in-memory computing (IMC)
architectures enables them for resource-constrained edge applications. In
addition to predictive uncertainty, however, the ability to be inherently
robust to noise in computation is also essential to ensure functional safety.
In particular, memristor-based IMCs are susceptible to various sources of
non-idealities such as manufacturing and runtime variations, drift, and
failure, which can significantly reduce inference accuracy. In this paper, we
propose a method to inherently enhance the robustness and inference accuracy of
BayNNs deployed in IMC architectures. To achieve this, we introduce a novel
normalization layer combined with stochastic affine transformations. Empirical
results in various benchmark datasets show a graceful degradation in inference
accuracy, with an improvement of up to $58.11\%$.